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Reliability Physics and Engineering: Time-To-Failure Modeling (Paperback)

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Description


1 Introduction 2 Materials and Device Degradation 2.1 Material/Device Parameter Degradation Modeling 2.1.1 Material/Device Parameter Decreases With Time 2.1.2 Material/Device Parameter Increases With Time 2.2 General Time-Dependent Degradation Models 2.3 Degradation Rate Modeling 2.4 Delays in the Start of Degradation 2.5 Competing Degradation Mechanisms 3 From Material/Device Degradation to Time-To-Failure 3.1 Time-To-Failure 3.2 Time-To-Failure Kinetics 4 Time-To-Failure Modeling 4.1 Flux-Divergence Impact on Time-To-Failure 4.2 Stress Dependence and Activation Energy 4.3 Conservative Time-To-Failure Models 4.4 Time-To-Failure Modeling Under High Stress References 5 Gaussian Statistics - An Overview 5.1 Normal Distribution 5.2 Probability Density Function 5.3 Statistical Process Control References 6 Time-To-Failure Statistics 6.1 Lognormal Probability Density Function 6.2 Weibull Probability Density Function 6.3 Multimodal Distributions 6.3.1 Multimodal Distribution (Separated In Time) 6.3.2 Mixed Multiple Failure Mechanisms References 7 Failure Rate Modeling 7.1 Device Failure Rate 7.2 Average Failure Rate 7.2.1 Lognormal Average Failure Rate 7.2.2 Weibull Average Failure Rate 7.3 Instantaneous Failure Rate 7.3.1 Lognormal Instantaneous Failure Rate 7.3.2 Weibull Instantaneous Failure Rate.

About the Author


Dr. J.W. McPherson is at McPherson Reliability Consulting, LLC.
Product Details
ISBN: 9783319033297
ISBN-10: 3319033298
Publisher: Springer
Publication Date: July 9th, 2015
Pages: 399
Language: English